InTech, 2012, 256 pages, ISBN: 9535104148 9789535104148 This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. Crystal Lattice Imaging Using Atomic Force Microscopy Atomic Force...
CRC Press, 2003, 310p. Background History of Microscopy Scanning Probe Microscopes (SPMs) Scanning Tunneling Microscope (STM) Electron Tunneling Atomic Force Microscope (AFM) Modes of Operation of AFM Simultaneous AFM and Scanning Near-Field Fluorescence (SNOM and SNOM–AFM) Friction Force Microscopy (FFM) STM and AFM Studies under Fluids Sample Preparation Procedures for STM...
Butterworth-Heinemann, Elsevier, 2009, 283 pages, ISBN: 1856175170 Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and...
Surface Science Reports 59 (2005) p.1–152
The atomic force microscope (AFM) is not only a tool to image the topography of solid surfaces at high resolution. It can also be used to measure force-versus-distance curves. Such curves, briefly called force curves, provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and...
Cham: CRC Press, 2022. — 457 p. Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in...
Elsevier Surface Science Reports 34 (1999) p.1-104 Atomic force microscopy (AFM) force-distance curves have become a fundamental tool in several fields of research, such as surface science, materials engineering, biochemistry and biology. Furthermore, they have great importance for the study of surface interactions from a theoretical point of view. Force-distance curves have...
Springer, 2019. — 424 p. — (NanoScience and Technology). — ISBN: 978-3-030-15611-4. The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their...
Taylor & Francis Group, 2012. — 283 p. With the invention of scanning probe techniques in the early 1980s, scientists can now play with single atoms, single molecules, and even single bonds. Force, dynamics, and function can now be probed at the single-molecule level. Molecular Manipulation with Atomic Force Microscopy (AFM) presents a series of topics that discuss concepts and...
Oxford University Press, 2010. — 248 p. ISBN: 978–0–19–957045–4 Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical...
Review of Modern Physics, volume 75, july 2003 p.1-35
This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its
invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum with atomic resolution. The most widely used technique for...
Монография. — New Jersey: JohnWiley & Sons, Inc., 2012. — 520 с. — ISBN: 978-0-470-63882-8 Эта книга рассказывает читателям об основных свойствах поверхности и о необходимости понимания зависимостей меж поверхностных сил от расстояния для получения даже простых данных от атомно-силового микроскопа (АСМ). Материал становится все более сложным на протяжении всей книги, объясняя...
Wiley-VCH, Weinheim, Germany, 2017 — 371 p. — ISBN: 3527340912. The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel...
Surface Science Reports 66 (2011) р.1–27 journal homepage: www.elsevier.com Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the surface potential on a broad range of materials. KPFM measurements require an understanding of both the details of the instruments and the physics of the measurements to obtain optimal results. The first part of...
Springer International Publishing, Switzerland, 2015. — 539 p. — (NanoScience and Technology) — ISBN: 9783319155876 This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging...
Springer-Verlag, Berlin, Heidelberg, 2009. — 409 p. — (NanoScience andTechnology) — ISBN: 9783642014949 Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since...
Springer-Verlag, Berlin, Heidelberg, 2002. — 447 p. — (NanoScience and Technology) — ISBN: 9783642627729 Atomic force microscopy (AFM) was invented in 1986 by G. Binnig and coworkers at Stanford University. Since then it has successfully achieved many outstanding results on micro- and nanoscales and even on atomic and molecular scales by simple contact measurements, although...
World Scientific Publishing Co. Pte. Ltd., 2016. — 341 p. — (Lessons from Nanoscience: A Lecture Note Series. Volume 4) — ISBN: 9814630357 The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many...
Springer-Verlag Berlin Heidelberg, 2012 — 334p. — (Springer Series in Surface Sciences 48) — ISBN: 978-3-642-22566-6 (eBook), 978-3-642-27113-7 (Softcover), 978-3-642-22565-9 (Hardcover). Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method...
Springer International Publishing AG, 2018. — 530 p. — (Springer Series in Surface Sciences 65). — ISBN: 3319756869; This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials,...
Springer International Publishing AG, 2018. — 530 p. — (Springer Series in Surface Sciences 65). — ISBN: 3319756869; This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials,...
2nd Edition. — Springer, 2019. — 329 p. — (NanoScience and Technology). — ISBN: 978-3030136531. This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer,...
Springer, 2015. - 382 pp. This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals...
Springer, 2024. — 390 p. — ISBN 978-3-031-44232-2. . From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal...
Springer, 2024. — 390 p. — ISBN 978-3-031-44233-9. . From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal...
Учебное пособие. — Тверь: Тверской государственный университет, 2023. — 96 с. Пособие предназначено для студентов естественнонаучных факультетов университетов для теоретического и практического освоения методов атомно-силовой микроскопии (АСМ), содержит материал по использованию про-граммного обеспечения сканирующего зондового микроскопа для анализа и статистической обработки...
Монография. — Тамбов: Тамбовский государственный технический университет, 2018. — 184 с. — ISBN 978-5-8265-1881-6. Изложены современные представления об исследовании поверхности твёрдых тел и органических объектов методом зондовой микроскопии. Рассмотрен принцип работы атомно-силовой микроскопии в различных режимах сканирования. Представлены возможности использования...
Учебное пособие для студ. фак. нано- и биомедицинских технологий. — Саратов: СГУ, 2006. — 23 с. Учебное пособие представляет собой руководство к практическим занятиям по курсу «Физика полупроводников». Содержит расширенное описание материала, знание которого необходимо при выполнении лабораторной работы по исследованию автоэлектронной эмиссии из металлов и наноуглеродных...
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